AFM ’ s path to atomic resolution
نویسنده
چکیده
viewed as a mechanical profiling technique that generates three-dimensional maps of surfaces by scanning a sharp probe attached to a cantilever over a surface. The forces that act between the tip of the cantilever and the sample are used to control the vertical distance. AFM’s potential to reach atomic resolution was foreseen in the original scientific publication2 but, for a long time, the spatial resolution of AFM was inferior to the resolution capability of its parent technique, STM.
منابع مشابه
5 Atomic force microscopy ’ s path to atomic resolution
We review the progress in the spatial resolution of atomic force microscopy (AFM) in vacuum. After an introduction of the basic principle and a conceptual comparison to scanning tunneling microscopy, the main challenges of AFM and the solutions that have evolved in the first twenty years of its existence are outlined. Some crucial steps along the AFM’s path towards higher resolution are discuss...
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تاریخ انتشار 2004